• DocumentCode
    2324012
  • Title

    A new statistical timing analyzer propagating delay and slew distributions simultaneously

  • Author

    Takahashi, Shingo ; Tsukiyama, Shuji

  • Author_Institution
    Dept. of Electr., Electron., & Commun. Eng., Chuo Univ., Tokyo
  • fYear
    2008
  • fDate
    Nov. 30 2008-Dec. 3 2008
  • Firstpage
    352
  • Lastpage
    355
  • Abstract
    Due to the progress of nanometer process technologies, variability of circuit parameters is increasing and the statistical static timing analysis (S-STA) has been studied intensively. The existing block-based S-STA algorithms assume that the distribution of delay of each circuit element does not change through the analysis. However, such a delay depends on the input-slew, and the slew to be considered in S-STA is also a random variable associated with a propagated signal for computing the distribution of arrival time (delay) of the signal. Therefore, in order to increase the accuracy of S-STA, the distribution of slew must be propagated together with delay distribution, and the delay of a circuit element must be calculated dynamically by using the propagated slew. In this paper, we propose an algorithm for such a novel S-STA by using Gaussian mixture model to represent the delay and slew distributions. Moreover, with the use of propagated slew, we propose an estimation method of the probability for two inputs to switch at the same time (Multiple Input Switching).
  • Keywords
    Gaussian processes; SPICE; delays; nanotechnology; network analysis; statistical analysis; switching networks; timing; Gaussian mixture model; delay distributions; multiple input switching; nanometer process technologies; slew distributions; statistical static timing analysis; Algorithm design and analysis; Delay effects; Distributed computing; Integrated circuit interconnections; Logic gates; Probability; Propagation delay; Random variables; Switches; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
  • Conference_Location
    Macao
  • Print_ISBN
    978-1-4244-2341-5
  • Electronic_ISBN
    978-1-4244-2342-2
  • Type

    conf

  • DOI
    10.1109/APCCAS.2008.4746032
  • Filename
    4746032