Terahertz absorption spectra of high purity metallic and semiconducting single-walled carbon nanotube thin films

Author

Ichida, M. ; Saito, S. ; Feng, Y. ; Miyata, Y. ; Yanagi, K. ; Kataura, H. ; Ando, H.

Author_Institution

Dept. of Phys., Konan Univ., Konan, Japan

fYear

2009

fDate

21-25 Sept. 2009

Firstpage

1

Lastpage

2

Abstract

Absorption spectra of high purity metallic and semiconducting single-walled carbon nanotubes separated by density-gradient ultracentrifugation method have been measured using THz time-domain spectroscopy. Absorbance in metallic nanotubes increase with increasing frequency up to 6 THz. This result suggests that the dielectronic properties even for high purity metallic nanotube samples can not be explained by simple Drude conduciton model.

Keywords

carbon nanotubes; elemental semiconductors; metallic thin films; nanotechnology; semiconductor nanotubes; semiconductor thin films; terahertz wave spectra; C; Drude conduciton model; THz time-domain spectroscopy; density-gradient ultracentrifugation method; dielectronic properties; metallic carbon nanotube; semiconducting single-walled carbon nanotube; terahertz absorption spectra; thin films; Carbon nanotubes; Electromagnetic wave absorption; Frequency; Optical films; Semiconductivity; Semiconductor films; Semiconductor thin films; Solids; Spectroscopy; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on

Conference_Location

Busan

Print_ISBN

978-1-4244-5416-7

Electronic_ISBN

978-1-4244-5417-4

Type

conf

DOI

10.1109/ICIMW.2009.5325722

Filename

5325722