• DocumentCode
    2330574
  • Title

    An incremental learning framework for estimating signal controllability in unit-level verification

  • Author

    Wen, Charles H P ; Wang, Li.-C. ; Bhadra, Jayanta

  • Author_Institution
    Nat. Chiao-Tung Univ., Hsinchu
  • fYear
    2007
  • fDate
    4-8 Nov. 2007
  • Firstpage
    250
  • Lastpage
    257
  • Abstract
    Unit-level verification is a critical step to the success of full-chip functional verification for microprocessor designs. In the unit-level verification, a unit is first embedded in a complex software that emulates the behavior of surrounding units, and then a sequence of stimuli is applied to measure the functional coverage. In order to generate such a sequence, designers need to comprehend the relationship between boundaries at the unit under verification and at the inputs to the emulation software. However, figuring out this relationship can be very difficult. Therefore, this paper proposes an incremental learning framework that incorporates an ordered-binary-decision-forest(OBDF) algorithm, to automate estimating the controllability of unit-level signals and to provide full-chip level information for designers to govern these signals. Mathematical analysis shows that the proposed OBDF algorithm has lower model complexity and lower error variance than the previous algorithms. Meanwhile, a commercial microprocessor core is also applied to demonstrate that controllability of input signals on the load/store unit in the microprocessor core can be estimated automatically and information about how to govern these signals can also be extracted successfully.
  • Keywords
    binary decision diagrams; controllability; learning (artificial intelligence); logic CAD; microprocessor chips; full-chip functional verification; incremental learning framework; microprocessor designs; ordered-binary-decision-forest; signal controllability; stimuli sequence; unit-level verification; Algorithm design and analysis; Controllability; Data mining; Embedded software; Emulation; Mathematical analysis; Mathematical model; Microprocessors; Signal design; Software measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-1381-2
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2007.4397274
  • Filename
    4397274