• DocumentCode
    2330825
  • Title

    Error analysis of free-form surfaces for manufacturing applications

  • Author

    Shao, Wei ; Guo, Junjie ; Shi, Enxiu ; Zhang, Tao

  • Author_Institution
    State Key Lab. for Manuf. Syst. Eng., Xi´´an Jiaotong Univ., Xi´´an
  • fYear
    2009
  • fDate
    25-27 May 2009
  • Firstpage
    589
  • Lastpage
    594
  • Abstract
    Error analysis of free-form surfaces is a requirement to assure quality and to reduce manufacturing costs and rework. This paper proposes a new approach and algorithms for the error analysis of free-form surfaces. Given the measured surface as an input the approach first uses a statistical method to determine the number of test-points with suitable sample size for shape error analysis. Then, the system applies a robust mathematic model, Implicit polynomials (IP), to construct the model of the test-points. To perform detailed comparison of the shapes, the CAD model is geometrically adjusted with the input using model-based matching algorithm developed in this paper. Once the CAD model is adjusted, it is compared with input to reveal the errors between their shapes. To accomplish this task a new shape matching algorithm is developed. Experimental results on error analysis of a variety of the machined metal skin of aircraft are reported to show the validity of the proposed methodology.
  • Keywords
    CAD; computational geometry; error analysis; manufacturing systems; quality assurance; solid modelling; statistical analysis; 3D model; CAD model; free-form surface; implicit polynomial; manufacturing application; model-based matching algorithm; quality assurance; shape error analysis; shape matching algorithm; statistical method; Costs; Error analysis; Manufacturing; Mathematical model; Robustness; Shape measurement; Size measurement; Solid modeling; Statistical analysis; Testing; Implicit polynomials; error analysis; free-form surfaces; shape matching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-2799-4
  • Electronic_ISBN
    978-1-4244-2800-7
  • Type

    conf

  • DOI
    10.1109/ICIEA.2009.5138217
  • Filename
    5138217