• DocumentCode
    2330901
  • Title

    Development of 3-D shapes estimation by using single X-ray image

  • Author

    Cho, Sung Man ; Shim, Hyuk-Hoon ; Jong-Hyeong Kim ; Song, Chun-Sam ; Kim, Joon Hyun ; Joo, Won Jong

  • Author_Institution
    Nano Manuf. Res. Center, Seoul Nat. Univ. of Technol., Seoul, South Korea
  • fYear
    2009
  • fDate
    21-23 Sept. 2009
  • Firstpage
    345
  • Lastpage
    350
  • Abstract
    X-ray images are heavily affected by noise which makes normal image processing not workable. This paper suggested a new method to identify the primary 3-D shape of an embedded object and its pose by using only single X-ray image. The image feature consists of corner points and edge/intersection lines of adjacent surfaces. The intensity of an X-ray image is attenuated exponentially with increasing the penetration thickness. The main finding is to model a precise exponential relationship to fit the variation of X-ray image intensity. It applied a least-square-method to the X-ray projection image and effectively extracted edges and intersection lines from the noise of X-ray image.
  • Keywords
    X-ray imaging; edge detection; exponential distribution; feature extraction; least squares approximations; shape measurement; shape recognition; 3D shape estimation; X-ray image intensity attenuation; X-ray image noise; X-ray projection image; corner points; edge detection; embedded object; exponential approximation; image feature; intersection line extraction; least square method; primary 3D shape; single X-ray image; vertex extraction; Costs; Digital signal processing; Hardware; Instruments; Paper technology; Shape; System testing; US Department of Defense; Weapons; X-ray imaging; Exponential approximation; Extraction edge; Leastsquar-method; X-ray;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optomechatronic Technologies, 2009. ISOT 2009. International Symposium on
  • Conference_Location
    Istanbul
  • Print_ISBN
    978-1-4244-4209-6
  • Electronic_ISBN
    978-1-4244-4210-2
  • Type

    conf

  • DOI
    10.1109/ISOT.2009.5326040
  • Filename
    5326040