A novel line detection method using magnetic sensor for the optical inspection of electrical short defects on TFT LCD

Author

Hwang, Il-Han ; Yang, Hee-Gu ; Choi, Sang-Su ; Lee, Seong-Yeol ; Jeong, Chang-Wook ; Jeong, Dae-Hwa

Author_Institution

Productivity Res. Inst. (PRI), LG Electron., Pyungtaek, South Korea

fYear

2009

fDate

21-23 Sept. 2009

Firstpage

215

Lastpage

218

Abstract

A novel detection method is suggested using magnetic sensor to detect the short-defect line on LCD-TFT panel. With the voltage applied to the TFT panel, current flows along the short-defect line generating magnetic field around it. By scanning the magnetic sensor across the TFT panel, the defect line can be detected. Vision inspection is performed along the detected line to find out the defect point. Three main types of short-defects on TFT panel are tested and their locations are successfully detected by the suggested method.

Keywords

automatic optical inspection; liquid crystal displays; magnetic fields; magnetic sensors; thin film transistors; LCD-TFT panel; electrical short defects; line detection; magnetic field; magnetic sensor; optical inspection; short defect line; thin films transistors; vision inspection; Electrical resistance measurement; Inspection; Liquid crystal displays; MOSFET circuits; Magnetic field measurement; Magnetic fields; Magnetic sensors; Optical sensors; Thin film transistors; Voltage; LCD; TFT; magnetic field; non-contact; short;

fLanguage

English

Publisher

ieee

Conference_Titel

Optomechatronic Technologies, 2009. ISOT 2009. International Symposium on

Conference_Location

Istanbul

Print_ISBN

978-1-4244-4209-6

Electronic_ISBN

978-1-4244-4210-2

Type

conf

DOI

10.1109/ISOT.2009.5326084

Filename

5326084