• DocumentCode
    2331810
  • Title

    Fault localization based on loop status monitoring

  • Author

    Xia, Chunming G. ; Howell, John

  • Author_Institution
    Dept. of Mech. Eng., Glasgow Univ., UK
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    844
  • Abstract
    A problem loop in a process plant containing a number of interacting PI or PID control loops is identified by comparing the overall loop performance indices associated with each of the loops involved. These indices are derived from a number of loop performance statistics that include the qualitative loop status, which can be one of seven categories. The derivation of the index is described and its performance is tested on various data sets. The background is given in a companion paper.
  • Keywords
    chemical technology; closed loop systems; control system analysis; fault location; performance index; process control; process monitoring; three-term control; two-term control; Eastman Chemical Company plant; closed loop assessment; fault localization; interacting PI control loops; interacting PID control loops; loop performance indices; loop performance statistics; loop status monitoring; process control; qualitative loop status; Degradation; Frequency; Identity-based encryption; Mechanical engineering; Monitoring; Statistics; Steady-state; Testing; Three-term control; Wavelet packets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications, 2002. Proceedings of the 2002 International Conference on
  • Print_ISBN
    0-7803-7386-3
  • Type

    conf

  • DOI
    10.1109/CCA.2002.1038712
  • Filename
    1038712