• DocumentCode
    2332357
  • Title

    A novel intensity based optical proximity correction algorithm with speedup in lithography simulation

  • Author

    Yu, Peng ; Pan, David Z.

  • Author_Institution
    Univ. of Texas, Austin
  • fYear
    2007
  • fDate
    4-8 Nov. 2007
  • Firstpage
    854
  • Lastpage
    859
  • Abstract
    It is important to reduce the optical proximity correction (OPC) runtime while maintaining a good result quality. In this paper, we obtain a better formula, which theoretically speeds up the widely used method, optimal coherent approximations (OCA´s), by a factor of 2times. We speed up the OPC algorithm further by making it intensity based (IB-OPC), because it requires much less intensity simulations than the conventional edge placement error (EPE) based OPC algorithms. In addition, the IB-OPC algorithm, which uses the efficiently computed sensitivity information, converges faster than the EPE based OPC. Our IB-OPC experimental results show a runtime speedup of up to 15times with a comparable result quality as of the EPE based OPC.
  • Keywords
    approximation theory; error analysis; photolithography; proximity effect (lithography); quality management; sensitivity analysis; conventional edge placement error; intensity based optical proximity correction algorithm; lithography simulation; optimal coherent approximations; Computational modeling; Computer simulation; Concurrent computing; Convergence; Hardware; Lithography; Multithreading; Optical sensors; Runtime; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-1381-2
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2007.4397371
  • Filename
    4397371