• DocumentCode
    2333020
  • Title

    You can´t control the unfamiliar: A study on the relations between aggregation techniques for software metrics

  • Author

    Vasilescu, Bogdan ; Serebrenik, Alexander ; van den Brand, Mark

  • Author_Institution
    Tech. Univ. Eindhoven, Eindhoven, Netherlands
  • fYear
    2011
  • fDate
    25-30 Sept. 2011
  • Firstpage
    313
  • Lastpage
    322
  • Abstract
    A popular approach to assessing software maintainability and predicting its evolution involves collecting and analyzing software metrics. However, metrics are usually defined on a micro-level (method, class, package), and should therefore be aggregated in order to provide insights in the evolution at the macro-level (system). In addition to traditional aggregation techniques such as the mean, median, or sum, recently econometric aggregation techniques, such as the Gini, Theil, Kolm, Atkinson, and Hoover inequality indices have been proposed and applied to software metrics. In this paper we present the results of an extensive correlation study of the most widely-used traditional and econometric aggregation techniques, applied to lifting SLOC values from class to package level in the 106 systems comprising the Qualitas Corpus. Moreover, we investigate the nature of this relation, and study its evolution on a subset of 12 systems from the Qualitas Corpus. Our results indicate high and statistically significant correlation between the Gini, Theil, Atkinson, and Hoover indices, i.e., aggregation values obtained using these techniques convey the same information. However, we discuss some of the rationale behind choosing between one index or another.
  • Keywords
    econometrics; software maintenance; software metrics; Qualitas Corpus; SLOC values; econometric aggregation techniques; software maintainability; software metrics; Correlation; Econometrics; Indexes; Java; Software; Software metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Maintenance (ICSM), 2011 27th IEEE International Conference on
  • Conference_Location
    Williamsburg, VI
  • ISSN
    1063-6773
  • Print_ISBN
    978-1-4577-0663-9
  • Electronic_ISBN
    1063-6773
  • Type

    conf

  • DOI
    10.1109/ICSM.2011.6080798
  • Filename
    6080798