• DocumentCode
    2335830
  • Title

    Chip Error Pattern Analysis in IEEE 802.15.4

  • Author

    Wu, Kaishun ; Tan, Haoyu ; Ngan, Hoi-Lun ; Ni, Lionel M.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2010
  • fDate
    14-19 March 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    IEEE 802.15.4 standard specifies physical layer (PHY) and medium access control (MAC)sublayer protocols for low-rate and low-power communication applications. In this protocol, every 4-bit symbol is encoded into a sequence of 32 chips that are actually transmitted over the air. The 32 chips as a whole is also called a pseudo-noise code (PN-Code). Due to complex channel conditions such as attenuation and interference, the transmitted PN-Code will often be received with some PN-Code chips corrupted. In this paper, we conduct a systematic analysis on these errors occurring at chip-level. We find that there are notable error patterns corresponding to different cases. Recognizing these patterns will enable us to identify the channel condition in great details. We believe that understanding what happened to the transmission in our setup can potentially bring benefit to channel coding, routing and error correction protocol design.
  • Keywords
    access protocols; channel coding; error correction codes; personal area networks; pseudonoise codes; routing protocols; IEEE 802.15.4 standard; channel coding; chip error pattern analysis; error correction protocol design; low-power communication; low-rate communication; medium access control sublayer protocols; physical layer; pseudo-noise code; routing protocol; symbol encoding; Access protocols; Attenuation; Channel coding; Communication standards; Error analysis; Interference; Media Access Protocol; Pattern analysis; Pattern recognition; Physical layer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    INFOCOM, 2010 Proceedings IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    0743-166X
  • Print_ISBN
    978-1-4244-5836-3
  • Type

    conf

  • DOI
    10.1109/INFCOM.2010.5462189
  • Filename
    5462189