• DocumentCode
    2336105
  • Title

    Electrode protrusions and particle chaining as factors affecting the dielectric strength of air

  • Author

    Dascalescu, L. ; Tobazéon, R.

  • Author_Institution
    Inst. Univ. de Technol., Lab. Univ. de Technol. Electr. et Electron. Avancees, Angouleme, France
  • Volume
    3
  • fYear
    1998
  • fDate
    12-15 Oct. 1998
  • Firstpage
    1994
  • Abstract
    Electrode protrusions and free particles have been demonstrated to reduce dramatically the breakdown voltage of insulating fluids. This paper examines two factors which affect the dielectric strength of gaseous insulators: (i) shape and size of electrode protrusions; and (ii) particle chain formation. A computer program, based on the boundary element method, was employed for the computation of the electric field modified by an electrode protrusion and/or a particle chain. The results regarding field enhancement were used as input data of another program that evaluated the dielectric strength of the air-gap. Two types of protrusions were studied: hemispheres and hemispherically-ended rods. One to ten conductive spheres were considered to be attracted to such protrusions and chain at the top of them. The computations showed that the large protrusions are more harmful than the small ones and that the dielectric strength of the air-gap decreases with the number of particles in a chain.
  • Keywords
    air gaps; boundary-elements methods; electric fields; electric strength; electrical engineering computing; electrodes; air insulation; air-gap; boundary element method; breakdown voltage; computer program; conductive spheres; dielectric strength; electric field; electrode protrusion shape; electrode protrusion size; electrode protrusions; field enhancement; free particles; gaseous insulators; hemispheres; hemispherically-ended rods; input data; particle chain formation; particle chaining; Air gaps; Boundary element methods; Contamination; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Gas insulation; Shape; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
  • Conference_Location
    St. Louis, MO, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4943-1
  • Type

    conf

  • DOI
    10.1109/IAS.1998.729883
  • Filename
    729883