• DocumentCode
    2336318
  • Title

    An automatic vernier scale method by CCD linear sensor

  • Author

    Wang, Hang ; Baba, Mitsuru ; Konishi, Tadataka

  • Author_Institution
    Fac. of Eng., Okayama Univ., Japan
  • fYear
    1994
  • fDate
    10-12 May 1994
  • Firstpage
    1353
  • Abstract
    In this paper, we propose a new automatic dimension and displacement measuring method for high resolution by using the principle of vernier caliper. In this method, the main scale and the vernier scale are replaced with two different pitch CCD linear image sensors, respectively. The system detects number of the pixel at which the main scale coincides with the vernier scale and can measure in higher resolution than the original CCD pitch. Consequently, the proposed method is effective for precise dimension and displacement measurement
  • Keywords
    CCD image sensors; digital simulation; displacement measurement; CCD linear image sensors; CCD pitch; automatic dimension measurement; automatic vernier scale method; displacement measurement; industrial measurement; vernier caliper; vernier scale; Charge coupled devices; Computer interfaces; Displacement measurement; Image sensors; Length measurement; Q measurement; Size measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
  • Conference_Location
    Hamamatsu
  • Print_ISBN
    0-7803-1880-3
  • Type

    conf

  • DOI
    10.1109/IMTC.1994.351804
  • Filename
    351804