DocumentCode
2336318
Title
An automatic vernier scale method by CCD linear sensor
Author
Wang, Hang ; Baba, Mitsuru ; Konishi, Tadataka
Author_Institution
Fac. of Eng., Okayama Univ., Japan
fYear
1994
fDate
10-12 May 1994
Firstpage
1353
Abstract
In this paper, we propose a new automatic dimension and displacement measuring method for high resolution by using the principle of vernier caliper. In this method, the main scale and the vernier scale are replaced with two different pitch CCD linear image sensors, respectively. The system detects number of the pixel at which the main scale coincides with the vernier scale and can measure in higher resolution than the original CCD pitch. Consequently, the proposed method is effective for precise dimension and displacement measurement
Keywords
CCD image sensors; digital simulation; displacement measurement; CCD linear image sensors; CCD pitch; automatic dimension measurement; automatic vernier scale method; displacement measurement; industrial measurement; vernier caliper; vernier scale; Charge coupled devices; Computer interfaces; Displacement measurement; Image sensors; Length measurement; Q measurement; Size measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location
Hamamatsu
Print_ISBN
0-7803-1880-3
Type
conf
DOI
10.1109/IMTC.1994.351804
Filename
351804
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