Properties of intense ion beams from pinch-beam diodes

Summary form only given. Properties of pulsed ion beams from a pinch-beam diode on the Gamble II generator are being evaluated with several different diagnostics. An intense 1to 2-MeV ion beam is extracted from the diode through a 2-/spl mu/m thick Kimfol and transported up to 2.2 m in 1-Torr air. Multiple-pinhole-camera, Thomson-parabola-ion-analyzer, Rutherford-scattering, and step-wedge-filter diagnostics are fielded in the gas region to determine ion-beam properties. Uniformity of ion emission from the polyethylene anode and ion-beam divergence are determined with a multiple pinhole camera located 0.5 m from the anode. Images recorded on radiachromic film indicate extremely non-uniform emission from the anode and a beam divergence of 0.12 to 0.16 rad. Beam composition is determined with the Thomson parabola ion analyzer located about 2 m from the polyethylene anode in order to sample ions from the 10-cm-diam anode. The beam is primarily protons with a carbon fraction of <1%. When the transport region is at 10/sup -4/ Torr, a carbon component is observed. Beam fluence and pulse duration are determined by measuring protons Rutherford-scattered from small-area, thin, aluminum foils located at distances of 0.4 to 2.2 m from the anode.