• DocumentCode
    2341256
  • Title

    WSN03-4: A Novel Semi-Markov Smooth Mobility Model for Mobile Ad Hoc Networks.

  • Author

    Zhao, Ming ; Wang, Wenye

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC
  • fYear
    2006
  • fDate
    Nov. 27 2006-Dec. 1 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Existing random mobility models have their limitations such as speed decay and sharp turn which have been demonstrated by the previous studies. More importantly, mobility models need to mimic the movements that abide by the physical law for accurate analysis and simulations of mobile networks. Therefore, in this paper, we propose a novel mobility model, semi-Markov smooth (SMS) model. Each SMS movement includes three consecutive phases: speed up phase, middle smooth phase, and slow down phase. Thus, the entire motion in the SMS model is smooth and consistent with the moving behaviors in real environment. Through steady state analysis, we demonstrate that SMS model has no average speed decay problem and always maintains a uniform spatial node distribution. The analytical results are validated by extensive simulation experiments. In addition, we compare the simulation results on link lifetime and percentage of node degree with random waypoint model, Gauss-Markov model and the proposed SMS model.
  • Keywords
    Gaussian processes; Markov processes; ad hoc networks; mobility management (mobile radio); random processes; Gauss-Markov model; SMS; middle smooth phase; mobile ad hoc networks; mobile networks; random waypoint model; semi-Markov smooth mobility model; slow down phase; speed decay; speed up phase; steady state analysis; Analytical models; DC generators; Gaussian processes; History; Large-scale systems; Microscopy; Mobile ad hoc networks; Mobile radio mobility management; Routing protocols; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Global Telecommunications Conference, 2006. GLOBECOM '06. IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    1930-529X
  • Print_ISBN
    1-4244-0356-1
  • Electronic_ISBN
    1930-529X
  • Type

    conf

  • DOI
    10.1109/GLOCOM.2006.940
  • Filename
    4151570