DocumentCode
2341451
Title
The analysis of packaging-induced failure in a cw laser diode
Author
Yoo, J.S. ; Lim, Gubong ; Kim, T.
fYear
1994
fDate
28 Aug-2 Sep 1994
Firstpage
108
Lastpage
108
Keywords
Diode lasers; Electron beams; Electron optics; Epitaxial layers; Failure analysis; Optical feedback; Optical pulse generation; Optical pumping; Packaging; Power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 1994 Conference on
Print_ISBN
0-7803-1789-0
Type
conf
DOI
10.1109/CLEOE.1994.636200
Filename
636200
Link To Document