• DocumentCode
    2342805
  • Title

    Proceedings 10th Asian Test Symposium

  • fYear
    2001
  • fDate
    19-21 Nov. 2001
  • Abstract
    The following topics are dealt with: design for testability; fault modeling; fault diagnosis; ATPG; embedded memory test; Iddq test; test compaction; memory test pattern generation; virtual tester; beam testing; SOC test; delay test; FSM; fault injection; analog test; fault tolerance; BIST; analog/mixed signal test; verification; test scheduling; and DFT.
  • Keywords
    application specific integrated circuits; automatic test pattern generation; delays; design for testability; fault diagnosis; fault simulation; fault tolerance; finite state machines; formal verification; integrated circuit testing; logic testing; mixed analogue-digital integrated circuits; scheduling; ATPG; FSM; I/sub ddq/ test; SOC test; analog test; beam testing; delay test; design for testability; embedded memory test; fault diagnosis; fault injection; fault modeling; fault tolerance; memory test pattern generation; mixed signal test; test compaction; test scheduling; verification; virtual tester;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2001. Proceedings. 10th Asian
  • Conference_Location
    Kyoto, Japan
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1378-6
  • Type

    conf

  • DOI
    10.1109/ATS.2001.990249
  • Filename
    990249
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2342805