Diagnosis by repeated application of specific test inputs and by output monitoring of the MISA

Author

Gössel, M. ; Ocheretnij, V. ; Chakrabarty, S.

Author_Institution

Dept. of Comput. Sci., Univ. of Potsdam, Germany

fYear

2001

fDate

2001

Firstpage

57

Lastpage

62

Abstract

A new diagnosis method for combinational circuits is proposed which is a modification of traditional signature analysis. By this method, instead of a technical fault the first erroneous test response in the presence of the considered fault is determined. Additionally to the accumulated signature a one-dimensional output sequence of the MILFSR is monitored during test and diagnosis. Some of the test inputs have to be repeatedly applied for diagnosis

Keywords

automatic testing; binary sequences; combinational circuits; fault diagnosis; integrated circuit testing; logic analysers; logic testing; shift registers; MILFSR; MISA; circuit under test; combinational circuits; diagnosis method; erroneous test response; multi-input signature analyzer; multiinput linear feedback shift register; one-dimensional output sequence; output monitoring; specific test inputs; Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computer science; Computerized monitoring; Fault diagnosis; Fault tolerance; Linear feedback shift registers;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2001. Proceedings. 10th Asian

Conference_Location

Kyoto

ISSN

1081-7735

Print_ISBN

0-7695-1378-6

Type

conf

DOI

10.1109/ATS.2001.990259

Filename

990259