• DocumentCode
    2343026
  • Title

    Radiated noise sources location based on MVDR near-field focused beamforming

  • Author

    Shi Jie ; Liu Bosheng ; Song Haiyan ; Zhao Longlong ; Li Ming

  • Author_Institution
    Coll. of Underwater Acoust. Eng., Harbin Eng. Univ., Harbin
  • fYear
    2008
  • fDate
    3-5 June 2008
  • Firstpage
    849
  • Lastpage
    852
  • Abstract
    Noise sources image can be used to determine the spatial distribution of the major noise sources. Thereby we can adopt damping and noise-reducing measures pertinently. In the near-field, compared to the conventional beamforming (CBF), focused beamforming should compensates the time-delay difference and the magnitude attenuation by spherical wave rules according to the different curvature radiuses between the source and array elements, and the time-delay difference value is the 2-dimensional function of both bearing and range. In this paper, the MVDR near-field focused beamforming algorithm and wideband MVDR near-field focused beamforming algorithm are presented. The location performance of both single frequency line spectrum noise and wideband noise signal is improved markedly. Because of making use of various spectrum band signal energy fully, we can scale the noise sources spatial distribution more roundly.
  • Keywords
    acoustic noise; acoustic signal processing; damping; noise abatement; MVDR near-field focused beamforming; magnitude attenuation; noise reduction; noise sources; radiated noise source location; single frequency line spectrum noise; spatial distribution; spherical wave; time-delay difference; two-dimensional function; wideband noise signal; Acoustic noise; Acoustical engineering; Array signal processing; Attenuation; Damping; Focusing; Frequency; Low-frequency noise; Noise measurement; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1717-9
  • Electronic_ISBN
    978-1-4244-1718-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2008.4582635
  • Filename
    4582635