• DocumentCode
    2343349
  • Title

    Using content-aware bitcells to reduce static energy dissipation

  • Author

    Koc, Fahrettin ; Simsek, Osman Seckin ; Ergin, Oguz

  • Author_Institution
    TOBB Univ. of Econ. & Technol., Ankara, Turkey
  • fYear
    2011
  • fDate
    9-12 Oct. 2011
  • Firstpage
    51
  • Lastpage
    56
  • Abstract
    Static energy dissipation is an increasing problem in contemporary processor design with shrinking feature sizes. Many schemes are proposed to cope with leakage in the literature ranging from using sleep transistors to lowering supply voltage. In this paper, we introduce a Conscious SRAM (CSRAM) design to lower static energy dissipation in the storage components of a processor. The proposed bitcell design adapts the body bias of its own transistors according to its contents. We show that the use of the proposed CSRAM cells results in significant reduction in the static energy dissipation of on-chip storage components without significant performance degradation. In order to reduce the area overhead introduced by the CSRAM we propose a simplified version of the cell at the circuit level. We also leverage the fact that the contents of adjacent bits of the stored values are highly dependent on each other, especially on the upper order bits of a value, and propose some architectural level solutions that lower the area overhead to as low as 7%.
  • Keywords
    SRAM chips; energy conservation; power aware computing; conscious SRAM design; contemporary processor design; content-aware bitcell; on-chip storage component; sleep transistor; static energy dissipation; static random access memory; Benchmark testing; Energy dissipation; Layout; Random access memory; Registers; Threshold voltage; Transistors; SRAM Bitcell; adaptive body bias; leakage reduction; register file; static energy dissipation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2011 IEEE 29th International Conference on
  • Conference_Location
    Amherst, MA
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4577-1953-0
  • Type

    conf

  • DOI
    10.1109/ICCD.2011.6081375
  • Filename
    6081375