Debugging integrated circuits: AI can help

Author

Marzouki, M. ; Courtois, B.

Author_Institution

IMAG/TIM3 Lab., Grenoble, France

fYear

1989

fDate

12-14 Apr 1989

Firstpage

184

Lastpage

191

Abstract

An overview of Pesticide, a Prolog-written expert system for integrated-circuit debugging is presented. Pesticide relies on the knowledge of structural and functional properties of both combinational and sequential ICs. Its external environment consists of a scanning electron microscope used in voltage contrast mode and linked to CAD tools. Particular attention is given to the modeling of the device under test, the strategies adopted for fault detection and localization within the circuit under test, and some simple execution examples

Keywords

automatic test equipment; automatic testing; circuit CAD; combinatorial circuits; electronic engineering computing; expert systems; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; scanning electron microscopy; sequential circuits; CAD tools; Pesticide; Prolog-written expert system; artificial intelligence; combinatorial ICs; fault detection; fault location; integrated-circuit debugging; scanning electron microscope; sequential ICs; voltage contrast mode; Artificial intelligence; Automatic testing; Circuit simulation; Circuit testing; Databases; Debugging; Diagnostic expert systems; Expert systems; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

European Test Conference, 1989., Proceedings of the 1st

Conference_Location

Paris

Print_ISBN

0-8186-1937-6

Type

conf

DOI

10.1109/ETC.1989.36242

Filename

36242