DocumentCode
2343668
Title
Faults in processor control subsystems: testing correctness and performance faults in the data prefetching unit
Author
Almukhaizim, Sobeeh ; Petrov, Peter ; Orailoglu, Alex
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
2001
fDate
2001
Firstpage
319
Lastpage
324
Abstract
The processor control subsystems have for a long time been recognized as a bottleneck in the process of achieving complete fault coverage through various functional test propagation approaches. The difficult-to-test corner cases are further accentuated in fault-resilient control subsystems as no functional effect is incurred as a result of the fault, even though performance suffers. We investigate the construction of software programs, capable of providing full fault coverage at minimal hardware cost, for one such fault resilient subsystem in processor architecture: the data prefetching unit. Experimental results confirm the efficacy of the proposed method
Keywords
automatic test pattern generation; built-in self test; design for testability; fault diagnosis; integrated circuit testing; microprocessor chips; data prefetching unit; difficult-to-test corner cases; fault coverage; fault-resilient control subsystems; full fault coverage; functional test propagation approaches; hardware cost; processor architecture; processor control subsystems; software programs; Buffer storage; Computer science; Control systems; Costs; Data engineering; Delay; Design for testability; Hardware; Prefetching; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location
Kyoto
ISSN
1081-7735
Print_ISBN
0-7695-1378-6
Type
conf
DOI
10.1109/ATS.2001.990303
Filename
990303
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