DocumentCode
2344098
Title
Built-out self-test (BOST) for analog circuits in a system LSI test solution to reduce test costs
Author
Hanai, Hisayoshi ; Yamada, Shinji ; Mori, Hisaya ; Yamashita, Eisaku ; Funakura, Teruhiko
Author_Institution
Manuf. Technol. & Production Manage. Div., Mitsubishi Electr. Corp., Japan
fYear
2001
fDate
2001
Firstpage
460
Abstract
BOST (built out self test), puts the high performance test unit on the performance-board and achieves high performance measurement. We focused on D/A and A/D converter testing and developed a BOST which is placed on the performance board and measures and analyzes the electrical D/A and A/D characteristics, statically, such as nonlinearity error, with high resolution and high accuracy in short periods by using a conventional logic tester in the factory. This report describes the outline of BOST and the effect for improvement of test accuracy, and reduction of test time
Keywords
analogue-digital conversion; automatic testing; digital-analogue conversion; integrated circuit testing; large scale integration; A/D converter; BOST; D/A converter; accuracy; analog circuits; built-out self-test; logic tester; nonlinearity error; performance measurement; resolution; system LSI; test accuracy; test costs; test time; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Electric variables measurement; Large scale integration; Logic testing; Performance analysis; Performance evaluation; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location
Kyoto
ISSN
1081-7735
Print_ISBN
0-7695-1378-6
Type
conf
DOI
10.1109/ATS.2001.990330
Filename
990330
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