• DocumentCode
    2345999
  • Title

    A new concept of ballasting mechanisms of microwave power transistors in class C operation

  • Author

    Sayed, M.M. ; Chen, J.T.C. ; Kakihana, S.

  • Author_Institution
    Hewlett-Packard Co., Palo Alto, CA, USA
  • fYear
    1974
  • fDate
    9-11 Dec. 1974
  • Firstpage
    302
  • Lastpage
    304
  • Abstract
    Emitter ballasting in class C microwave power transistors is shown to cause a sacrifice of output power and collector efficiency. The use of base impedance balasting resulted in the development of an experimental 4 GHz microwave power transistor which is capable of providing 3 watts of output power with a 6.4 dB power gain and a 65% collector efficiency. The experimental data on the collector current dependence of the power gain, and the spatial temperature distribution of the device working in class C and class A operations are presented. General guidelines for designing class C microwave transistors for optimum performance are given.
  • Keywords
    electric impedance; microwave power transistors; base impedance ballasting; class C microwave power transistors; class-A operation; collector current dependence; collector efficiency; emitter ballasting; frequency 4 GHz; power gain; spatial temperature distribution; Electronic ballasts; Microwave amplifiers; Microwave transistors; RNA; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 1974 International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1974.6219751
  • Filename
    6219751