DocumentCode
2347482
Title
Evaluation of reliability characteristics for ramified computing systems
Author
Sydor, Andriy
Author_Institution
Lviv Polytech. Nat. Univ.
fYear
2003
fDate
8-10 Sept. 2003
Firstpage
80
Lastpage
83
Abstract
Main reliability characteristics of unrestorable symmetric computing systems ramified to level 2 and with ageing ramified elements are examined. Expressions for the failure probability, the failure frequency and the failure rate are worked out in the cases when the reliability of ageing output elements is circumscribed by the Rayleigh distribution or by the Weibull distribution
Keywords
Weibull distribution; failure analysis; reliability theory; Rayleigh distribution; Weibull distribution; ageing element; failure frequency; failure probability; failure rate; reliability characteristic; unrestorable symmetric ramified computing system; Aging; Control charts; Distributed computing; Equations; Exponential distribution; Frequency; Hazards; Reliability theory; Shape; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2003. Proceedings of the Second IEEE International Workshop on
Conference_Location
Lviv
Print_ISBN
0-7803-8138-6
Type
conf
DOI
10.1109/IDAACS.2003.1249522
Filename
1249522
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