• DocumentCode
    2347894
  • Title

    Projection learning models

  • Author

    Toh, Kar-Ann ; Teoh, Andrew Beng Jin

  • Author_Institution
    Biometrics Eng. Res. Center, Yonsei Univ., Seoul
  • fYear
    2008
  • fDate
    3-5 June 2008
  • Firstpage
    2151
  • Lastpage
    2155
  • Abstract
    This paper proposes a learning framework based on projection. Essentially, the learning framework exploits the advantages of linear learning paradigms for regression and classification applications. By incorporating appropriate nonlinear basis or embedding functions, the projection learning framework can be applied to learn arbitrary functions. Several preliminary case studies are provided to evident the behavior of a few specific projection models.
  • Keywords
    learning (artificial intelligence); pattern classification; regression analysis; classification applications; linear learning paradigms; projection learning models; regression applications; Biometrics; Explosions; Polynomials; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1717-9
  • Electronic_ISBN
    978-1-4244-1718-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2008.4582899
  • Filename
    4582899