DocumentCode
2347894
Title
Projection learning models
Author
Toh, Kar-Ann ; Teoh, Andrew Beng Jin
Author_Institution
Biometrics Eng. Res. Center, Yonsei Univ., Seoul
fYear
2008
fDate
3-5 June 2008
Firstpage
2151
Lastpage
2155
Abstract
This paper proposes a learning framework based on projection. Essentially, the learning framework exploits the advantages of linear learning paradigms for regression and classification applications. By incorporating appropriate nonlinear basis or embedding functions, the projection learning framework can be applied to learn arbitrary functions. Several preliminary case studies are provided to evident the behavior of a few specific projection models.
Keywords
learning (artificial intelligence); pattern classification; regression analysis; classification applications; linear learning paradigms; projection learning models; regression applications; Biometrics; Explosions; Polynomials; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4244-1717-9
Electronic_ISBN
978-1-4244-1718-6
Type
conf
DOI
10.1109/ICIEA.2008.4582899
Filename
4582899
Link To Document