• DocumentCode
    2347924
  • Title

    Clustering based identification of faulty ICs using IDDQ tests

  • Author

    Jandhyala, Sri ; Balachandran, Hari ; Menon, Sankaran ; Jayasumana, Anura

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1998
  • fDate
    12-13 Nov 1998
  • Firstpage
    48
  • Lastpage
    52
  • Abstract
    Technological advances in design and process have led to questions being raised about the applicability of IDDQ testing. The main concern is the inability to differentiate between normal and faulty quiescent currents in ICs. In this paper, we propose a new methodology aimed at addressing this concern through the application of clustering techniques to identify ICs with abnormal IDDQ values. Preliminary results of applying this technique in production test are also presented
  • Keywords
    CMOS digital integrated circuits; fault diagnosis; integrated circuit testing; logic testing; production testing; CMOS; IDDQ tests; abnormal IDDQ values; clustering based identification; faulty ICs; logic testing; production test; quiescent currents; Application specific integrated circuits; CMOS integrated circuits; Condition monitoring; Fault detection; Fault diagnosis; Instruments; Leakage current; Logic devices; Logic testing; Process design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-8186-9191-3
  • Type

    conf

  • DOI
    10.1109/IDDQ.1998.730756
  • Filename
    730756
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2347924