• DocumentCode
    2349737
  • Title

    The future of SOI transistor technology

  • Author

    Doris, Bruce ; Khakifirooz, Ali ; Cheng, Kangguo

  • Author_Institution
    IBM Res. at Albany, Albany, NY, USA
  • fYear
    2011
  • fDate
    3-6 Oct. 2011
  • Firstpage
    1
  • Lastpage
    27
  • Abstract
    A collection of slides from the author´s conference presentation is given. The following topics are discussed: performance enhancement substrates; conventional devices; fully depleted devices; SOI substrates; planar FD options and non-planar FD options.
  • Keywords
    performance evaluation; silicon-on-insulator; substrates; transistors; SOI substrates; SOI transistor technology; conventional devices; fully depleted devices; nonplanar FD options; performance enhancement substrates; Doping; FinFETs; Gate leakage; Logic gates; Performance evaluation; Subthreshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference (SOI), 2011 IEEE International
  • Conference_Location
    Tempe, AZ
  • ISSN
    1078-621X
  • Print_ISBN
    978-1-61284-761-0
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2011.6081711
  • Filename
    6081711