DocumentCode
2351898
Title
P1H-1 Scattering Parameters Measurement for the Determination of Layered Media Properties with 25 Mhz Ultrasound
Author
Ermert, H. ; Vogt, M.
Author_Institution
Inst. of High Frequency Eng., Ruhr Univ. Bochum
fYear
2006
fDate
2-6 Oct. 2006
Firstpage
1402
Lastpage
1405
Abstract
Non destructive evaluation (NDE) of layered media is of interest in many applications like food packaging and coating of substrates. In this paper, an approach for the measurement and reconstruction of acoustic parameters and thicknesses of layered media with high-frequency ultrasound (HFUS) in the 25 MHz range is presented. Ultrasonic two-port measurements are performed analog to conventional network analysis (NWA) of electrical networks in high-frequency metrology. A linear network model is employed to reconstruct layered media, which consist of discrete layers connected in series. Simulations and measurements, which were performed to evaluate the approach, are presented. The potential and limitations of the proposed technique is discussed
Keywords
food technology; inhomogeneous media; substrates; ultrasonic materials testing; ultrasonic measurement; ultrasonic scattering; 25 MHz; acoustic parameter reconstruction; food packaging; high-frequency metrology; high-frequency ultrasound; layered media properties; linear network model; nondestructive evaluation; scattering parameters measurement; substrate coating; ultrasonic two-port measurement; Acoustic measurements; Coatings; Electric variables measurement; Nonhomogeneous media; Packaging; Performance evaluation; Scattering parameters; Thickness measurement; Ultrasonic imaging; Ultrasonic variables measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2006. IEEE
Conference_Location
Vancouver, BC
ISSN
1051-0117
Print_ISBN
1-4244-0201-8
Electronic_ISBN
1051-0117
Type
conf
DOI
10.1109/ULTSYM.2006.271
Filename
4152127
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