• DocumentCode
    235361
  • Title

    Improving the bond quality of copper wire bonds using a friction model approach

  • Author

    Althoff, Simon ; Neuhaus, Jan ; Hemsel, Tobias ; Sextro, Walter

  • Author_Institution
    Univ. of Paderborn, Paderborn, Germany
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    1549
  • Lastpage
    1555
  • Abstract
    In order to increase mechanical strength, heat dissipation and ampacity and to decrease failure through fatigue fracture, wedge copper wire bonding is being introduced as a standard interconnection method for mass production. To achieve the same process stability when using copper wire instead of aluminum wire a profound understanding of the bonding process is needed. Due to the higher hardness of copper compared to aluminum wire it is more difficult to approach the surfaces of wire and substrate to a level where van der Waals forces are able to arise between atoms. Also, enough friction energy referred to the total contact area has to be generated to activate the surfaces. Therefore, a friction model is used to simulate the joining process. This model calculates the resulting energy of partial areas in the contact surface and provides information about the adhesion process of each area. The focus here is on the arising of micro joints in the contact area depending on the location in the contact and time. To validate the model, different touchdown forces are used to vary the initial contact areas of wire and substrate. Additionally, a piezoelectric tri-axial force sensor is built up to identify the known phases of pre-deforming, cleaning, adhering and diffusing for the real bonding process to map with the model. Test substrates as DBC and copper plate are used to show the different formations of a wedge bond connection due to hardness and reaction propensity. The experiments were done by using 500 μm copper wire and a standard V-groove tool.
  • Keywords
    adhesion; circuit reliability; deformation; diffusion; fatigue cracks; friction; interconnections; lead bonding; van der Waals forces; Cu; adhering process; adhesion process; ampacity improvement; bond quality improvement; cleaning process; diffusing process; fatigue fracture failure; friction energy; friction model; heat dissipation; mechanical strength; piezoelectric triaxial force sensor; predeforming process; size 500 mum; total contact area; van der Waals forces; wedge copper wire bonding; Bonding; Copper; Finite element analysis; Force; Friction; Substrates; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897500
  • Filename
    6897500