Lightwave component analysis for balanced and on-wafer measurement of opto-electronic components for 100GB/S transmission and RF-over-optics

Author

Haisch, Hansjoerg

Author_Institution

Agilent Technol. R&D & Marketing GmbH, Germany

fYear

2011

fDate

4-6 Oct. 2011

Firstpage

67

Lastpage

68

Abstract

Advanced calibration, optical mode-conditioning and de-embedding methods enable full complex S-Parameter characterization of high speed electrical multiport, single and multi-mode fiber opto-electronic components necessary to support short-reach interconnect and long-reach advanced complex modulation format for 100GE transmission and RF-over-Optics.

Keywords

S-parameters; calibration; optical interconnections; optical modulation; optoelectronic devices; radio-over-fibre; RF-over-optics; bit rate 100 Gbit/s; calibration; complex S-Parameter characterization; high speed electrical multiport; lightwave component analysis; long-reach advanced complex modulation; multimode fiber opto-electronic components; on-wafer measurement; optical de-embedding methods; optical mode-conditioning; short-reach interconnect; Calibration; Optical fibers; Optical receivers; Optical transmitters; Optical variables measurement; Scattering parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

Avionics, Fiber- Optics and Photonics Technology Conference (AVFOP), 2011 IEEE

Conference_Location

San Diego, CA

Print_ISBN

978-1-4244-7344-1

Type

conf

DOI

10.1109/AVFOP.2011.6082130

Filename

6082130