DocumentCode
2354382
Title
Modeling of stress-enhancement at defects inside cable insulation
Author
Person, T.J. ; Yang, K. ; Jiang, J.
Author_Institution
Dow Chem. Co., Somerset, NJ
fYear
2006
fDate
11-14 June 2006
Firstpage
506
Lastpage
508
Abstract
AC breakdowns are commonly used as a performance indicator for power cables, and yet the data generated can be misinterpreted if the test section of cable is found to have a manufacturing defect. As an example, in a recent publication, dielectric a breakdown value on a 17-year field aged cable was treated as a "suspension" by the authors after the discovery of a conductor shield skip at the failure location; and yet, others have taken the same data set and have analyzed the uncensored data as indicative of the material performance. In an effort to resolve the differences, the same data set is considered here, with an assumption that degree of aging is not significantly impacted by any enhancement of field-aging stresses. Statistical analysis is performed to determine if the questionable breakdown value can be considered an outlier. A 2-dimensional finite element analysis based upon the shape of the defect enables an estimate of the local stress enhancement factor, and a "corrected" breakdown value is calculated. The original authors conservative treatment of the questionable breakdown value as a "suspension" is supported by analysis with inclusion of a stress-corrected breakdown value, and the two approaches yield similar failure distributions. Use of the uncorrected value in discussions related to failure probabilities on the low-stress side of the distribution is shown to substantially underestimate failure stresses
Keywords
ageing; cable shielding; conductors (electric); electric breakdown; failure analysis; finite element analysis; insulation testing; power cable insulation; power cable testing; statistical analysis; 2-dimensional finite element analysis; AC breakdown; conductor shield; failure location; field-aging stress; power cable insulation defect; statistical analysis; Aging; Cable insulation; Cable shielding; Communication cables; Conducting materials; Electric breakdown; Failure analysis; Power cable insulation; Power cables; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
Conference_Location
Toronto, Ont.
ISSN
1089-084X
Print_ISBN
1-4244-0333-2
Type
conf
DOI
10.1109/ELINSL.2006.1665367
Filename
1665367
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