• DocumentCode
    2355633
  • Title

    P3N-2 Packaging of SAW Devices with Small, Low Profile and Hermetic Performance

  • Author

    Kawachi, O. ; Sakinada, K. ; Kaneda, Y. ; Ono, S.

  • Author_Institution
    Fujitsu Media Devices Ltd., Yokohama
  • fYear
    2006
  • fDate
    2-6 Oct. 2006
  • Firstpage
    2289
  • Lastpage
    2292
  • Abstract
    Cellular-phone markets are moving quite aggressively towards module integration and as a result, the miniaturization of devices has been accelerated. Especially SAW filters, which are key devices in RF parts, are demanded to realize a small size, low profile, with high reliability performance. Conventional SAW filters use a HTCC package with cavity structure and metal sealing to obtain high reliability performance. This structure restricts the miniaturization of SAW filters. In order to reduce size, HTCC without cavity structure and resin sealing are commonly used. However, this structure does not contribute to the high reliability performance. This paper describes the realization of a new miniaturized SAW filter which is a combination of HTCC without cavity structure and metal sealing by using a unique packaging technique to achieve a low profile with high reliability performance. The technique has been realized by using cluster sealing with solder. The optimization of the PKG design and sealing pressure was performed in solder sealing. In addition, by using plating in the outer coating, a high reliability performance can easily be achieved. Results of reliability testing including mechanical, electrical and moisture sensitivity will be discussed
  • Keywords
    cellular radio; moisture; packaging; reliability; sealing materials; sensitivity; soldering; surface acoustic wave filters; HTCC package; PKG design; SAW devices; SAW filters; cavity structure; cellular phone markets; cluster sealing; device miniaturization; electrical sensitivity; hermetic performance; high reliability performance; mechanical sensitivity; metal sealing; module integration; moisture sensitivity; packaging; reliability testing; resin sealing; sealing pressure; solder sealing; Acceleration; Coatings; Design optimization; Moisture; Packaging; Radio frequency; Resins; SAW filters; Surface acoustic wave devices; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2006. IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1051-0117
  • Print_ISBN
    1-4244-0201-8
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2006.468
  • Filename
    4152324