• DocumentCode
    2357804
  • Title

    Cooling of a 32 inch plasma display monitor

  • Author

    Luiten, G. A Wendy

  • Author_Institution
    Philips Digital Syst. Lab., Eindhoven, Netherlands
  • fYear
    2002
  • fDate
    12-14 March 2002
  • Firstpage
    119
  • Lastpage
    124
  • Abstract
    The development of the cooling design of a 32-inch plasma display monitor for consumer use is described. Two distinct challenges were met. First: abandon the use of fan cooling while coping with a 3-fold energy density increase. Second: meet a strict timing schedule of market introduction. Different thermal design methodologies were used in the different product development phases to meet these challenges, resulting in a successful market introduction and an EISA award for best plasma TV 2001-2002. Cooling the monitor was not a case of identifying and eliminating a single problem cause, but rather an exercise of systematic risk assessment and follow up in the entire development tract. Essential for this complex cooling job were the use of CFD, transferring the geometry directly from the CAD database, careful determination of measurement conditions and a measurement plan, and continuous measurements on prototypes of increasing complexity, starting as early as possible.
  • Keywords
    computational fluid dynamics; consumer electronics; cooling; electronic data interchange; electronic design automation; flat panel displays; plasma displays; product development; risk management; television equipment; thermal management (packaging); 32 inch; CAD database; CFD; EISA award; computational fluid dynamics; continuous measurements; cooling design; energy density; fan cooling; market introduction timing schedule; measurement conditions; measurement plan; plasma display monitor; product development phases; prototype complexity; set behavior evaluation; systematic risk assessment; thermal design methodologies; unit geometry; Computational fluid dynamics; Cooling; Design methodology; Geometry; Monitoring; Plasma displays; Product development; Risk management; Spatial databases; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-7327-8
  • Type

    conf

  • DOI
    10.1109/STHERM.2002.991356
  • Filename
    991356