• DocumentCode
    2358011
  • Title

    2002 cumulative bibliography of articles on semiconductor thermal measurement, management and modeling

  • Author

    Siegal, Bernard S.

  • Author_Institution
    Thermal Eng. Associates Inc., Menlo Park, CA, USA
  • fYear
    2002
  • fDate
    12-14 March 2002
  • Firstpage
    176
  • Lastpage
    196
  • Abstract
    The bibliography provides information on semiconductor thermal characteristics, measurement techniques and results, management techniques, hardware applications, modeling and computational techniques, and other pertinent information. Areas covered include thermal and temperature measurements, thermal management, device and package performance, modeling, computations, and software techniques.
  • Keywords
    bibliographies; integrated circuit measurement; modelling; packaging; bibliography; computational techniques; hardware applications; management techniques; modeling; package performance; semiconductor thermal measurement; software techniques; temperature measurements; thermal management; Application software; Bibliographies; Computational modeling; Computer applications; Hardware; Measurement techniques; Semiconductor device packaging; Software packages; Temperature measurement; Thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-7327-8
  • Type

    conf

  • DOI
    10.1109/STHERM.2002.991365
  • Filename
    991365