DocumentCode
2358011
Title
2002 cumulative bibliography of articles on semiconductor thermal measurement, management and modeling
Author
Siegal, Bernard S.
Author_Institution
Thermal Eng. Associates Inc., Menlo Park, CA, USA
fYear
2002
fDate
12-14 March 2002
Firstpage
176
Lastpage
196
Abstract
The bibliography provides information on semiconductor thermal characteristics, measurement techniques and results, management techniques, hardware applications, modeling and computational techniques, and other pertinent information. Areas covered include thermal and temperature measurements, thermal management, device and package performance, modeling, computations, and software techniques.
Keywords
bibliographies; integrated circuit measurement; modelling; packaging; bibliography; computational techniques; hardware applications; management techniques; modeling; package performance; semiconductor thermal measurement; software techniques; temperature measurements; thermal management; Application software; Bibliographies; Computational modeling; Computer applications; Hardware; Measurement techniques; Semiconductor device packaging; Software packages; Temperature measurement; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management, 2002. Eighteenth Annual IEEE Symposium
Conference_Location
San Jose, CA, USA
ISSN
1065-2221
Print_ISBN
0-7803-7327-8
Type
conf
DOI
10.1109/STHERM.2002.991365
Filename
991365
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