• DocumentCode
    2359606
  • Title

    Bond wire design for eXtreme Switch devices

  • Author

    Hauck, Torsten ; Kolbeck, Anton

  • Author_Institution
    Freescale Halbleiter Deutschland GmbH, Munich, Germany
  • fYear
    2010
  • fDate
    26-28 April 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Freescale´s third-generation eXtreme Switch devices set performance standards for automotive lighting. They are tailored to drive high-intensity discharge (HID) xenon, halogen and light-emitting diode (LED) lamps. For example, a halogen lamp draws high levels of current when first turned on, but much less once it has stabilized. The ICs therefor allow the lamps to draw high levels of current when needed at turn-on but less during operation. Hence, these devices have to withstand the event of an inrush current each time a lamp is switched on. Package and wire bond design have to consider the transient characteristics of Joule heating and heat transfer. The authors developed an approach for the current carrying analysis of bond wires in power packages. It is based on closed form solutions of the heat equation at single current pulse, repeated current pulses or arbitrary inrush current profiles. This paper focuses on the analysis of Joule heating in bond wires. We will solve the initial and boundary value problem for the Joule heating at an inrush current pulse. The solution will be validated with thermo-electric finite element simulation. We will then draw conclusions for the wire bond design.
  • Keywords
    LED lamps; automotive electronics; discharge lamps; finite element analysis; lead bonding; Joule heating; automotive lighting; bond wire design; boundary value problem; extreme switch devices; heat equation; heat transfer; high-intensity discharge lamps; inrush current; light-emitting diode lamps; thermoelectric finite element simulation; Automotive engineering; Bonding; Heat transfer; Heating; High intensity discharge lamps; Light emitting diodes; Packaging; Surges; Switches; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
  • Conference_Location
    Bordeaux
  • Print_ISBN
    978-1-4244-7026-6
  • Type

    conf

  • DOI
    10.1109/ESIME.2010.5464545
  • Filename
    5464545