• DocumentCode
    2359619
  • Title

    The Non-equal-interval Direct Verhulst GM(1,1) Model with Two Times Fitting and its Application to Test Data Processing

  • Author

    Luo, Youxin ; Zeng, Bin

  • Author_Institution
    Coll. of Mech. Eng., Hunan Univ. of Arts & Sci., Changde, China
  • fYear
    2009
  • fDate
    25-27 Aug. 2009
  • Firstpage
    1831
  • Lastpage
    1835
  • Abstract
    Test data processing is an important role in test process. The principle, under which the Grey systems theory is applied in data processing, is that the test system can be considered as a Grey system. In such a system, unknown system´s information can be determined by using known information. The non-equal-interval direct Verhulst GM(1,1) model through two times fitting was built which extended equal interval to non-equal-interval and suited for general data modeling and estimating parameters of direct Verhulst GM(1,1). The new model need not pre-process the primitive data, accumulated generating operation (AGO) and inverse accumulated generating operation (IAGO). It is not only suited for equal interval data modeling, but also for non-equal interval data modeling. Its calculation is simple, higher accuracy and used convenient. The example shows that the new model is simple and practical. The new model is worth expanding and applying in test data processing or test on-line monitoring.
  • Keywords
    data handling; grey systems; equal interval data modeling; grey systems theory; inverse accumulated generating operation; nonequal-interval direct Verhulst GM model; parameter estimation; test data processing; test on-line monitoring; two times fitting; Art; Data processing; Educational institutions; Environmental economics; Fatigue; Mechanical engineering; Power generation economics; Power system economics; Predictive models; System testing; 1); Grey system; Verhulst GM(1; data processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    INC, IMS and IDC, 2009. NCM '09. Fifth International Joint Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-5209-5
  • Electronic_ISBN
    978-0-7695-3769-6
  • Type

    conf

  • DOI
    10.1109/NCM.2009.418
  • Filename
    5331403