• DocumentCode
    2359687
  • Title

    Viscoelastic properties effect on solder ball failure analyses

  • Author

    Kim, Yeong K. ; Gang, Jin Hyuk ; Lee, Bo-Young

  • Author_Institution
    Sch. of Aerosp. & Mech. Eng., Korea Aerosp. Univ., Goyang, South Korea
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    641
  • Lastpage
    645
  • Abstract
    The effects of material properties modeling on the solder failure analyses by numerical simulations are studied. The packaging structure of plastic ball grid array on printed circuit board was modeled. Two different types of molding compounds and two different types of substrates were employed and combined for the plastic ball grid array package modeling. The material properties were assumed as temperature dependent elastic and viscoelastic, and the strain energy densities of solder balls were calculate and analyzed. The results showed that the mechanism of the energy density developments were very different depending on the material properties modeling and their combinations. This study demonstrated that appropriate modeling of the material properties is critical for interpretation and understanding the microelectronics reliability mechanisms.
  • Keywords
    ball grid arrays; integrated circuit reliability; numerical analysis; printed circuits; solders; viscoelasticity; energy density development; material properties modeling; microelectronics reliability mechanism; molding compound; numerical simulation; packaging structure; plastic ball grid array package modeling; printed circuit board; solder ball failure analysis; strain energy density; viscoelastic property effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702717
  • Filename
    5702717