Single event effect and radiation damage results for candidate spacecraft electronics

Author

Bryan, Martha V O ; LaBel, Kenneth A. ; Reed, Robert A. ; Barth, Janet L. ; Seidleck, Christina M. ; Marshall, Peter ; Marshall, Paul ; Carts, Martin

Author_Institution

Jackson & Tull Chartered Eng., Washington, DC, USA

fYear

1998

fDate

36000

Firstpage

39

Lastpage

50

Abstract

We present both heavy ion and proton single event effect (SEE) and radiation damage ground test results for candidate spacecraft electronics. Devices tested include optocouplers, programmable devices, and fiber links

Keywords

analogue integrated circuits; analogue-digital conversion; digital-analogue conversion; integrated circuit testing; integrated logic circuits; integrated memory circuits; ion beam effects; optical communication equipment; opto-isolators; programmable logic devices; proton effects; space vehicle electronics; ADC; DAC; analog ICs; digital ICs; fiber link equipment; ground test results; heavy ion SEE; optocouplers; programmable devices; proton SEE; radiation damage; single event effect; spacecraft electronics; Aerospace electronics; Electronic equipment testing; Laboratories; Neutrons; Performance evaluation; Protons; Single event upset; Space vehicles; Test facilities; User centered design;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 1998. IEEE

Conference_Location

Newport Beach, CA

Print_ISBN

0-7803-5109-6

Type

conf

DOI

10.1109/REDW.1998.731469

Filename

731469