• DocumentCode
    2360088
  • Title

    Reflow study of Pb-free Sn-3.5Ag solder with Ni-Sn-P metallization

  • Author

    Yang, Y. ; Balaraju, J.N. ; Chen, Z.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2010
  • fDate
    8-10 Dec. 2010
  • Firstpage
    801
  • Lastpage
    806
  • Abstract
    Electrolessly plated Ni-P has been extensively studied due to its high coating uniformity, selectivity and low coating stress. However, the use of lead-free solders accelerates interfacial reaction because they have higher melting points and higher Sn content than the conventional Pb-Sn solders. In this work, we developed a ternary electroless Ni-Sn-P (6~7 wt.% of P and 15~17 wt.% of Sn) alloy to be used as the soldering metallization. Besides having good solderability, the presence of Sn in electroless Ni-Sn-P changes the diffusion process during soldering reflow. Comparison was made with the results obtained from commercial binary Ni-P (6~7 wt.% of P) metallization. The microstructure of the intermetallic compounds (IMCs) for Ni-P/Sn-3.5Ag and Ni-Sn-P/Sn-3.5Ag soldering reactions were investigated under different reflow durations with a reflow temperature of 260°C. The diffusion mechanisms of solder reaction for both types of solder joints were discussed. In addition, it was found that the formation of microvoids is much more difficult in Ni-Sn-P solder joints than that in Ni-P solder joints, indicating Ni-Sn-P solder joints will have better mechanical properties.
  • Keywords
    ball grid arrays; flip-chip devices; melting point; metallisation; nickel alloys; phosphorus alloys; reflow soldering; silver alloys; solders; tin alloys; BGA; Ni-Sn-P; SnAg; coating stress; diffusion process; flip chip technology; interfacial reaction; intermetallic compound microstructure; lead-free solders; mechanical property; melting points; microvoids; reflow study; reflow temperature; solder joints; soldering metallization; soldering reflow; temperature 260 degC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2010 12th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-8560-4
  • Electronic_ISBN
    978-1-4244-8561-1
  • Type

    conf

  • DOI
    10.1109/EPTC.2010.5702739
  • Filename
    5702739