DocumentCode
2360558
Title
Full-wave analysis of RF SAW filter packaging
Author
Finch, C. ; Yang, X. ; Wu, T. ; Abbott, B.
Author_Institution
Central Florida Univ., Orlando, FL, USA
Volume
1
fYear
2001
fDate
2001
Firstpage
81
Abstract
As SAW filters move to higher frequencies and smaller sizes, the packaging structure has an increasing effect on the electrical performance of the device. In order to correctly design a SAW filter, the package performance must be considered concurrently in the design process. This paper describes several new methods for package simulation in which a full-wave electromagnetic (EM) simulator is used to create a package model. A ceramic chip and wire package is used to demonstrate the techniques. The package model is combined with a model of a SAW ladder filter at 1960 MHz and compared to measured data. The full-wave simulation is first performed on an empty package, with inductors used to represent bond wires. More accuracy can be achieved if simplified bond wires are included in the full-wave analysis, although computation time increases. A more accurate model of the bond wire shape increases simulation time, with no increase in accuracy. Our results demonstrate that full-wave analysis techniques are useful for predicting critical parameters such as the shape and rejection level of a SAW filter
Keywords
UHF filters; ceramic packaging; digital simulation; electronic engineering computing; finite element analysis; ladder filters; packaging; radiofrequency filters; surface acoustic wave filters; 1960 MHz; Ansoft; FEM; HFSS; High Frequency Structure Simulator; RF SAW filter packaging; SAW ladder filter; SMP-12 package; ceramic chip/wire package; electromagnetic simulator; finite element simulator; full-wave EM simulator; full-wave analysis; package model; package performance; package simulation; Bonding; Ceramics; Computational modeling; Electromagnetic modeling; Packaging; Process design; Radio frequency; SAW filters; Shape; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2001 IEEE
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-7177-1
Type
conf
DOI
10.1109/ULTSYM.2001.991583
Filename
991583
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