• DocumentCode
    2361159
  • Title

    Polarization profiling of the surface region of PVDF and P(VDF-TrFE)

  • Author

    Ploss, Bernd ; Bianzano, Oliver

  • Author_Institution
    Inst. fur Angewandte Phys., Karlsruhe Univ., Germany
  • fYear
    1994
  • fDate
    7-9 Sep 1994
  • Firstpage
    206
  • Lastpage
    211
  • Abstract
    Inhomogeneous polarization profiles are a typical property of ferroelectric polymers. Particularly in the surface region, the occurrence of a nonpolar layer is often observed. Different mechanisms can cause the decrease of the polarization near the surface. The first is the injection of charge from the metal contacts into the polymer during the poling when high electric fields are applied to the sample. The second is a structural variation of the sample near the surface e. g., a lower degree of crystallinity than in the bulk. The LIMM method i.e., a scan of the polarization profile with thermal waves, is particularly appropriate for an investigation of the surface near region of a sample. The resolution of LIMM has been improved to be better than 100 nm by an increase of the modulation frequencies into the MHz region. With this increased resolution, the surface near polarization in samples of polyvinylidenefluoride and its copolymers with trifluorethylene has been investigated
  • Keywords
    dielectric polarisation; electrets; ferroelectric materials; high field effects; polymer blends; polymer films; polymers; 100 nm; 104 to 108 Hz; P(VDF-TrFE) films; PVDF films; charge injection; degree of crystallinity; electrets; ferroelectric polymers; laser intensity modulation method method; metal contacts; nonpolar layer; polarization profiles; thermal waves; Current measurement; Frequency domain analysis; Frequency modulation; Intensity modulation; Optical propagation; Piezoelectric polarization; Polymers; Pyroelectricity; Temperature; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 1994. (ISE 8), 8th International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-1940-0
  • Type

    conf

  • DOI
    10.1109/ISE.1994.514769
  • Filename
    514769