• DocumentCode
    2363602
  • Title

    Plannable test selection criteria for FSMs extracted from operational specifications

  • Author

    Paradkar, Amit

  • Author_Institution
    Center for Software Eng., IBM Thomas J. Watson Res. Center, Hawthorne, NY, USA
  • fYear
    2004
  • fDate
    2-5 Nov. 2004
  • Firstpage
    173
  • Lastpage
    184
  • Abstract
    Model-based test generation (MBTG) is becoming an area of active research. Several MBTG approaches extract a finite state machine (FSM) from a given model, and use structural (mostly transition) coverage of the extracted FSM as a test selection criteria. In this paper, we demonstrate inadequacy of structural coverage criteria, and propose a set of test selection criteria for extracted FSMs. Our models are described in terms of operations provided by the system under test (SUT). Each operation is specified as a set of possible results each with a guard condition and a set of update actions on its parameters and the system state. The proposed test selection criteria are based on (1) mutations of guard conditions and update actions, (2) concept of a session, which targets errors of SUT not committing the updated system state to persistent storage, and (3) 2-way coverage of independent operations available in a given FSM state. We describe an AI planning based algorithm for finding a sequence of operation invocations to satisfy our proposed test selection criteria. We illustrate our test selection criteria, and report results of a case study which compares fault detection capability of our proposed test selection criteria with that of structural criteria.
  • Keywords
    finite state machines; formal specification; program testing; software reliability; FSM; finite state machine; model-based test generation; operational specification; test selection criteria; Artificial intelligence; Automata; Electronic mail; Error correction; Fault detection; Genetic mutations; Software engineering; State-space methods; System testing; Thyristors; EFSM-based Test Selection; Model-Based Test Generation; Mutation-based Test Selection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 2004. ISSRE 2004. 15th International Symposium on
  • ISSN
    1071-9458
  • Print_ISBN
    0-7695-2215-7
  • Type

    conf

  • DOI
    10.1109/ISSRE.2004.28
  • Filename
    1383116