DocumentCode
236581
Title
Graphene metrology
Author
Janssen, T.J.B.M. ; Giusca, C. ; Gallop, J. ; Hao, Liangliang ; Kazakova, Olga ; Panchal, V. ; Pearce, Roger ; Tzalenchuk, A.
Author_Institution
Nat. Phys. Lab., Teddington, UK
fYear
2014
fDate
24-29 Aug. 2014
Firstpage
662
Lastpage
663
Abstract
We present details of different characterisation techniques for graphene with the aim of linking morphology and functional properties in a quantitative and reproducible way. Rapid non-invasive quality control is essential for industrial production of large quantities of this material.
Keywords
electrical conductivity measurement; graphene; joining processes; microwave materials; microwave measurement; quality control; C; functional property; graphene metrology; industrial production; linking morphology; noncontact microwave conductivity measurement; rapid noninvasive quality control; Conductivity; Graphene; Metrology; Microwave measurement; Resistance; Silicon carbide; Substrates; Graphene; graphene morphology; graphene topography; measurement standards; quantum Hall effect;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location
Rio de Janeiro
ISSN
0589-1485
Print_ISBN
978-1-4799-5205-2
Type
conf
DOI
10.1109/CPEM.2014.6898559
Filename
6898559
Link To Document