• DocumentCode
    2366928
  • Title

    Preparation and electrical conductivity of Ni/NiO composites using microwave radiation

  • Author

    Panapoy, M. ; Supattanapalapol, S. ; Ksapabutr, B.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Silpakorn Univ., Nakhon Pathom
  • fYear
    2008
  • fDate
    24-27 March 2008
  • Firstpage
    452
  • Lastpage
    457
  • Abstract
    Nanocrystals of nickel (Ni) and nickel oxide (NiO) composites were synthesized in a short time by the microwave assisted sol-gel process using nickel nitrate hexahydrate as the raw material and nitric acid as the catalyst. For conventional calcination, Ni/NiO composites showed the electrical conductivity in the range of 1.94 times 10-9 - 8.40 times 10-9 S/m. For a microwave-induced solution combustion synthesis, the electrical conductivity of Ni/NiO composites was in the range of 0.1-3.4 S/m. The amount of Ni and its crystallite size can be tuned by the microwave parameters (microwave power and exposure time), leading to the formation of Ni/NiO nanocomposites. With increasing the total exposure energy above 40 kJ during microwave radiation, the crystallite size of NiO phase was enhanced and the electrical conductivity of Ni/NiO composites was reduced. Moreover, SEM and TEM analysis revealed that the Ni/NiO nanoparticles were obtained.
  • Keywords
    combustion synthesis; electrical conductivity; nanostructured materials; nickel; nickel compounds; scanning electron microscopy; sol-gel processing; transmission electron microscopy; Ni-NiO; SEM; TEM; electrical conductivity; microwave radiation; microwave-induced solution combustion synthesis; nanocrystal composites; nickel nitrate hexahydrate; sol-gel process; Calcination; Combustion; Conductivity; Crystallization; Lead; Nanocomposites; Nanocrystals; Nanoparticles; Nickel; Raw materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1572-4
  • Electronic_ISBN
    978-1-4244-1573-1
  • Type

    conf

  • DOI
    10.1109/INEC.2008.4585526
  • Filename
    4585526