• DocumentCode
    2367217
  • Title

    Cellular automata based test structures with logic folding

  • Author

    Sikdar, Biplab K. ; Das, Sukanta ; Roy, Samir ; Ganguly, Niloy ; Das, Debesh K.

  • Author_Institution
    Comput. Sci. & Technol., Bengal Eng. & Sci. Univ., West Bengal, India
  • fYear
    2005
  • fDate
    3-7 Jan. 2005
  • Firstpage
    71
  • Lastpage
    74
  • Abstract
    This work presents an efficient test solution for VLSI circuits. The test structure is designed with GF(2P) CA. The introduction to an innovative scheme of logic folding optimizes the cost of test logic that can not be feasible with the flattened structure of GF(2) CA/LFSR.
  • Keywords
    Galois fields; VLSI; cellular automata; integrated circuit testing; logic testing; optimisation; VLSI circuits; cellular automata based test structures; logic folding; test logic cost optimization; Automatic testing; Built-in self-test; Circuit testing; Computer science; Design engineering; Logic circuits; Logic design; Logic testing; Polynomials; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2005. 18th International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-2264-5
  • Type

    conf

  • DOI
    10.1109/ICVD.2005.63
  • Filename
    1383256
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2367217