Modeling electromagnetic radiation at high-density PCB/connector interfaces

Author

Xinxin Tian ; Halligan, Matthew ; Xiao Li ; Kiyeong Kim ; Hung-Chuan Chen ; Connor, Samuel ; Archambeault, Bruce ; Cracraft, M. ; Ruehli, Albert ; Drewniak, James

Author_Institution

Huazhong Univ. of Sci. & Technol., Wuhan, China

fYear

2014

fDate

4-8 Aug. 2014

Firstpage

97

Lastpage

102

Abstract

Electromagnetic radiation for a commercial printed circuit board (PCB) connector is investigated in this paper. The simulation models of the connector are shown to be validated by comparing measured and simulated S-parameters. Analytical formulas are provided to calculate the total loss and the radiated power from a PCB/connector structure when material losses are known. The total power loss for the considered geometry is shown to be dominated by material loss rather than radiated power loss. Termination schemes and additional geometry details in the connector model are also studied for their effects on the radiated power.

Keywords

S-parameters; electromagnetic waves; printed circuit interconnections; Electromagnetic radiation; S-parameters; electromagnetic radiation; high-density PCB-connector interfaces; material loss; radiated power; total power loss; Conductors; Connectors; Dielectrics; Materials; Ports (Computers); Scattering parameters; Semiconductor device modeling; Connectors; Electromagnetic radiation; Printed circuit board connectors; Radiated power; Scattering parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on

Conference_Location

Raleigh, NC

Print_ISBN

978-1-4799-5544-2

Type

conf

DOI

10.1109/ISEMC.2014.6898950

Filename

6898950