Design retargetable platform system for microprocessor functional test

Author

Ling, Liu ; Wennan, Feng ; Song, Jia ; Anping, Jiang ; Lijiu, Ji

Author_Institution

IME, Peking Univ., Beijing, China

fYear

2003

fDate

16-19 Nov. 2003

Firstpage

458

Lastpage

461

Abstract

Microprocessors are extremely versatile and complexity that present significantly test challenges. This paper describes a retargetable functional test platform system design for various microprocessors. Characterized by configurable test environment generator, retargetable assembler and strong ATPG the platform system could automatically produce different test environment and assemble out relative test codes to adapt to the microprocessor under test. Experiments show that the platform system works correctly, flexibly and efficiently.

Keywords

automatic test pattern generation; circuit complexity; design for testability; integrated circuit testing; microprocessor chips; ATPG; assembler; code mapping description language; configurable test environment generator; dataflow; design retargetable platform system; instruction-level retargetability; microprocessor functional test; relative test codes; Assembly systems; Automatic test pattern generation; Automatic testing; Character generation; Circuit testing; Design for testability; Digital systems; Integrated circuit testing; Microprocessors; System testing; Test pattern generators; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2003. ATS 2003. 12th Asian

ISSN

1081-7735

Print_ISBN

0-7695-1951-2

Type

conf

DOI

10.1109/ATS.2003.1250856

Filename

1250856