DocumentCode
236902
Title
Numerical investigation of glass-weave effects on high-speed interconnects in printed circuit board
Author
Xinxin Tian ; Yao-Jiang Zhang ; Lim, Jungyoul ; Qiu, K. ; Brooks, Richard ; Ji Zhang ; Jun Fan
Author_Institution
Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2014
fDate
4-8 Aug. 2014
Firstpage
475
Lastpage
479
Abstract
Numerical method is used to investigate the glass weave effects on via coupling and trace transmission properties. Studies indicate that a simple two-dimensional periodic structure is accurate enough for via coupling simulations while more complicated three-dimensional glass-weave structures have to be used for studies of trace transmission properties. Analytical formulas are provided to estimate the first resonant frequency of the glass weaves. The impact of trace-glass-weave orientations on resonances of traces has been investigated for both single-ended and differential striplines. It has been demonstrated that statistical Gaussian distribution of pitch sizes due to fabrication tolerance and the dielectric losses can reduce the glass-weave effects. The studies here are useful for better understanding of the high-frequency signal integrity performance of printed circuit boards.
Keywords
Gaussian distribution; dielectric losses; high-speed integrated circuits; integrated circuit interconnections; periodic structures; printed circuits; strip lines; dielectric losses; differential striplines; fabrication tolerance; glass weave effects; high-frequency signal integrity performance; high-speed interconnects; numerical method; printed circuit boards; resonant frequency; single-ended striplines; statistical Gaussian distribution; three-dimensional glass-weave structures; trace transmission properties; trace-glass-weave orientations; two-dimensional periodic structure; via coupling; Couplings; Dielectrics; Glass; Laminates; Periodic structures; Resonant frequency; Weaving; Glass-weave; S-parameter; printed circuit boards; resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location
Raleigh, NC
Print_ISBN
978-1-4799-5544-2
Type
conf
DOI
10.1109/ISEMC.2014.6899019
Filename
6899019
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