DocumentCode
236910
Title
Evaluation of radiated emissions from multi-port integrated connector modules (ICM) by S-parameters
Author
Hongmei Fan ; Jianquan Lou ; Hailong Zhang ; Jinghan Yu ; Bhobe, Alpesh ; Feng Ji ; Dewen Xu ; Wenbin Ma ; Xinyi Hu
Author_Institution
Cisco Syst. (China) R&D Co. Ltd., Shanghai, China
fYear
2014
fDate
4-8 Aug. 2014
Firstpage
496
Lastpage
500
Abstract
In this paper we present a systematic method to evaluate radiation of multi-port integrated connector modules (ICM) by S-parameters. A novel test jig is designed and built to measure S-parameters of two columns of ICM ports simultaneously. Based on radiation physics of ICM, a radiation model is created and an F factor to correlate S-parameters to far field radiation is defined. A good correlation is found between the F value and radiation from ICM ports.
Keywords
S-parameters; electric connectors; electromagnetic compatibility; multiport networks; F factor; ICM ports; ICM radiation physics; S-parameters; electromagnetic compatibility; far field radiation; multiport integrated connector modules; radiated emission evaluation; systematic method; test jig; Connectors; Correlation; Crosstalk; Integrated circuit modeling; Ports (Computers); Scattering parameters; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location
Raleigh, NC
Print_ISBN
978-1-4799-5544-2
Type
conf
DOI
10.1109/ISEMC.2014.6899023
Filename
6899023
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