DocumentCode
2369580
Title
Theory of workfunction control of silicides by doping for future Si-nano-devices based on fundamental physics of why silicides exist in nature
Author
Nakayama, T. ; Kakushima, K. ; Nakatsuka, O. ; Machida, Y. ; Sotome, S. ; Matsuki, T. ; Ohmori, K. ; Iwai, H. ; Zaima, S. ; Chikyow, T. ; Shiraishi, K. ; Yamada, K.
Author_Institution
Dept. of Phys., Chiba Univ., Chiba, Japan
fYear
2010
fDate
6-8 Dec. 2010
Abstract
We have revealed by the first-principles calculations that the workfunction of silicide is controlled by the high-density dopant existing in the silicide itself, and the selective doping into Si or Ni site is essential to realize such control. In addition, we showed that these doping properties are closely related to fundamental physics of silicides; why NixSiy exists and why AuxSiy not exists in nature. These findings might give a new guideline to design silicide-electrode contacts for future 10nm nano-devices.
Keywords
ab initio calculations; electrodes; nickel compounds; semiconductor doping; work function; Ni site; NixSiy; Si nanodevices; Si site; doping; first principles calculations; high-density dopant; silicide-electrode contacts; silicides; size 10 nm; work function control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location
San Francisco, CA
ISSN
0163-1918
Print_ISBN
978-1-4424-7418-5
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2010.5703369
Filename
5703369
Link To Document